TEM time can be booked through the booking system . TEM grids: continuous, holey and lacey films on 300 mesh Cu are available. See specimen preparation facilities page for details on plasma cleaner, glow discharge system and cryo-plunge instrument. Fischione Model 2045 - Motorized dual axis tomography.Fischione Model 2021 - Analytical tomography single tilt (+/- 80 degrees).High visibility low-background beryllium double tilt optimised for EDS.CrystalPack enables users to do compucentric β tilting, rapid toggling between diffraction conditions and can automatically tilt to the relevant zone axes.Maps 3 can acquire multiple S/TEM images from a sample automatically by shifting the CompuStage, changing magnification and subsequently aligning and stitching all the images to create one image with high-resolution details.S/TEM tomography including option of EDS tomography acquisition.EELS acquisition can be performed at 80, 120 or 200 kV. EELS can be performed using Gatan's Enfinium ER (977) spectrometer which includes UltraFast DualEELS spectrum imaging (allows simultaneous acquisition of low- and core-loss spectra) and simultaneous EDS and EELS through Velox.The high sensitivity and the absence of a detector window allow the detection of all elements down to and including boron. Four Silicon Drift Detector's (SDD) are perfectly integrated in the X-TWIN objective lens and offer maximum collection efficiency with a solid angle of 0.9 srad.
Super-X EDS detector system with superior sensitivity and ultimate performance in EDS spectroscopy and fast EDS mapping.Selected area electron diffraction and microprobe STEM diffraction mapping.TEM point resolution/information limit: 0.25 nm/ 0.12 nm, STEM resolution: 0.16 nm.It allows 4k x 4k images to be acquired at 40 frames per second (and 512 x 512 pixels at 320 fps). Ceta 16M camera with speed enhancement designed for imaging and diffraction applications.Schottky X-FEG electron source operated at accelerating voltages of 60, 80, 120 or 200 kV.The Talos F200X G2 is a 200 kV FEG Scanning Transmission Electron Microscope (S/TEM), which is designed for fast, precise and quantitative characterization of nano-materials.
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